Name: advanced test methods for srams
SKU: 3405012
Price: 97.78 EUR
Availability: InStock
Author: bosio,dilillo,girard,pravossoudovitch,virazel
ISBN: 9781441909374

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Type

Physical Book

Publisher

Springer

Author

bosio,dilillo,girard,pravossoudovitch,virazel

Language

English

Pages

171

ISBN

1441909370

ISBN13

9781441909374

Synopsis "advanced test methods for srams"

modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. memories are particularly prone to defects since they exploit the technology limits to get the highest density. this book is an invaluable guide to the testing and diagnostics of the latest generation of sram, one of the most widely applied types of memory. classical methods for testing memory are designed to handle the so-called static faults, but these test solutions are not sufficient for faults that are emerging in the latest very deep sub-micron (vdsm) technologies. these new fault models, referred to as dynamic faults, are not covered by classical test solutions and require the dedicated test sequences presented in this book.