Hallo! Tracked shipping to Netherlands with Delivery Duty Paid for just €7 

Ship to
Netherlands
0

My Account

  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional

menu

Select your country

Americas

Europe

Rest of the world

portada Atomic Force Microscopy: A Concise Introduction
Type
Physical Book
Publisher
Author
Language
English
Pages
250
Format
Paperback
Dimensions
22.9x15.2x1.2 cm
ISBN13
9789819824304

Atomic Force Microscopy: A Concise Introduction

Burnham Nancy A (Author) · World Scientific Publishing Company · Paperback

Atomic Force Microscopy: A Concise Introduction - Burnham Nancy a

Cheaper New Book Imported to Netherlands
Delivery: 06 Oct - 13 Oct Shipping: 15 to 19 business days.
€ 67,55
Faster New Book Imported to Netherlands
Delivery: 23 Sep - 25 Sep Shipping: 6 to 7 business days.
€ 69,04
Import costs and 9% BTW included in the price ✅
€ 67,55

Choose the list to add your product or create one New List

Go to My Wishlists
Calculate shipping cost

Synopsis "Atomic Force Microscopy: A Concise Introduction"

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.Part I - AFM Instrumentation: Explains the working principles, components, and imaging modes of atomic force microscopy, enabling readers to confidently obtain high-quality topographic images from any AFM system.Part II - Force-Curve Acquisition and Interpretation: Guides readers through force spectroscopy, demonstrating how force-distance curves are acquired and interpreted while connecting the results to underlying physical and materials science principles.Advanced Chapter - Dynamic AFM Techniques: Introduces dynamic and resonance-based AFM, using complex numbers and differential equations to explain advanced imaging and measurement methods.

Customers reviews

More customer reviews
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)

Frequently Asked Questions about the Book

Is the book original?

All books in our catalog are Original.

In what language is the book written?

The book is written in English.

What is the format of this book?

The binding of this edition is Paperback.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews