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portada CMOS Plasma and Process Damage
Type
Physical Book
Year
2026
Language
English
Pages
466
Format
Paperback
Dimensions
23.5x15.5 cm
ISBN13
9783031890314

CMOS Plasma and Process Damage

Kirk Prall (Author) · Springer Nature Switzerland · Paperback

CMOS Plasma and Process Damage - Kirk Prall

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Synopsis "CMOS Plasma and Process Damage"

This book discusses the complex technology of building CMOS computer chips and covers some of the unusual problems that can occur during chip manufacturing. Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems. 

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