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portada data mining and diagnosing ic fails
Type
Physical Book
Author
Publisher
Year
2010
Language
English
Pages
250
Format
Paperback
Dimensions
23.4x15.6x1.4 cm
Weight
0.39 kg.
ISBN
1441937676
ISBN13
9781441937674
Categories

data mining and diagnosing ic fails

Leendert M. Huisman (Author) · Springer · Paperback

data mining and diagnosing ic fails - Huisman, Leendert M.

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Synopsis "data mining and diagnosing ic fails"

There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques from other data analysis environments are appropriate for analyzing IC fails, but have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. The description techniques and analysis routines are sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.

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