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portada Elements of Electromigration. Electromigration in 3D IC technology
Type
Physical Book
Publisher
Author
Year
2025
Pages
132
Format
Paperback
Dimensions
24.6x17.4 cm
ISBN13
9781032470283

Elements of Electromigration. Electromigration in 3D IC technology

King-Ning Tu;Yingxia Liu (Author) · CRC Press · Paperback

Elements of Electromigration. Electromigration in 3D IC technology - King-Ning Tu;Yingxia Liu

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Synopsis "Elements of Electromigration. Electromigration in 3D IC technology"

In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.

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