Name: focused beam methods
Price: 39.96 EUR
Availability: InStock
Author: Schultz, John W.
ISBN: 9781480092853

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Type

Physical Book

Author

John W. Schultz

Publisher

Createspace

Year

2012

Language

English

Pages

142

Format

Paperback

Dimensions

23.4 x 15.6 x 0.9 cm

Weight

0.29 kg.

ISBN

1480092851

ISBN13

9781480092853

Synopsis "focused beam methods"

Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials.

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