Hallo! Tracked shipping to Netherlands with Delivery Duty Paid for just €7 

Ship to
Netherlands
0

My Account

  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional

menu

Select your country

Americas

Europe

Rest of the world

portada High Quality Test Pattern Generation and Boolean Satisfiability
Type
Physical Book
Publisher
Author
Language
English
Pages
211
Format
Paperback
ISBN13
9781489988478
Edition No.
2012th

High Quality Test Pattern Generation and Boolean Satisfiability

Stephan Eggersglüß (Author) · Springer · Paperback

High Quality Test Pattern Generation and Boolean Satisfiability - Stephan Eggersglüß

Cheaper New Book Imported to Netherlands
Delivery: 02 Oct - 06 Oct Shipping: 15 to 16 business days.
€ 103,90
Faster New Book Imported to Netherlands
Delivery: 18 Sep - 22 Sep Shipping: 5 to 6 business days.
€ 127,00
Import costs and 9% BTW included in the price ✅
€ 103,90

Choose the list to add your product or create one New List

Go to My Wishlists
Calculate shipping cost

Synopsis "High Quality Test Pattern Generation and Boolean Satisfiability"

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly;Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model;Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.

Customers reviews

More customer reviews
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)

Frequently Asked Questions about the Book

Is the book original?

All books in our catalog are Original.

In what language is the book written?

The book is written in English.

What is the format of this book?

The binding of this edition is Paperback.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews