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portada high resolution x-ray diffractometry and topography
Type
Physical Book
Publisher
Author
Year
1998
Language
English
Pages
264
ISBN
0850667585
ISBN13
9780850667585
Categories

high resolution x-ray diffractometry and topography

Bowen, D. Keith (Author) · crc press · Physical Book

high resolution x-ray diffractometry and topography - bowen, d. keith

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€ 346,20
Import costs and 9% BTW included in the price ✅
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