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portada high speed and highly accurate tip-scanning atomic force microscope
high speed and highly accurate tip-scanning atomic force microscopehigh speed and highly accurate tip-scanning atomic force microscopehigh speed and highly accurate tip-scanning atomic force microscope
Type
Physical Book
Publisher
Author
Pages
136
ISBN
3639002709
ISBN13
9783639002706

high speed and highly accurate tip-scanning atomic force microscope

Dong-Yeon Lee (Author) · vdm verlag dr. mueller e.k. · Physical Book

high speed and highly accurate tip-scanning atomic force microscope - dong-yeon lee

New Book Imported to Netherlands
Delivery: 09 Nov - 16 Nov Shipping: 12 to 16 business days.
€ 66,80
Import costs and 9% BTW included in the price ✅
€ 66,80

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Synopsis "high speed and highly accurate tip-scanning atomic force microscope"

a novel high speed and highly accurate tip scanning afm (ts-afm) head which uses a flexure guided xy and z scanning system has been developed. moreover, additional components including a coarse z-stage, an optical microscope with a motorized focus sta ...

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