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portada microelectronic reliability vol. i: test and diagnostics
Type
Physical Book
Author
Introduction by
Preface by
Publisher
Year
1989
Language
English
Pages
396
Format
Hardcover
Dimensions
23.8x16.1x3 cm
Weight
0.77 kg.
ISBN
0890062846
ISBN13
9780890062845
Categories

microelectronic reliability vol. i: test and diagnostics

Edward B. Hakim (Author, Introduction by, Preface by) · Artech House Publishers · Hardcover

microelectronic reliability vol. i: test and diagnostics - Hakim, Edward B. ; Hakim, Edward B. ; Hakim, Edward B.

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Delivery: 07 Sep - 09 Sep Shipping: 5 to 6 business days.
€ 183,88
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Synopsis "microelectronic reliability vol. i: test and diagnostics"

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

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