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portada Modeling Nanoscale Imaging in Electron Microscopy
Type
Physical Book
Publisher
Language
English
Pages
182
Format
Paperback
Dimensions
22.9x15x1.3 cm
Weight
0.29 kg.
ISBN13
9781489997289

Modeling Nanoscale Imaging in Electron Microscopy

Vogt, Thomas ; Dahmen, Wolfgang ; Binev, Peter (Author) · Springer · Paperback

Modeling Nanoscale Imaging in Electron Microscopy - Vogt, Thomas ; Dahmen, Wolfgang ; Binev, Peter

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Synopsis "Modeling Nanoscale Imaging in Electron Microscopy"

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.

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