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portada Mos Interface Physics, Process and Characterization
Type
Physical Book
Publisher
Author
Language
English
Pages
174
Format
Paperback
ISBN13
9781032106281
Edition No.
1

Mos Interface Physics, Process and Characterization

Shengkai Wang Xiaolei Wang (Author) · Crc Press · Paperback

Mos Interface Physics, Process and Characterization - Shengkai Wang Xiaolei Wang

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Synopsis "Mos Interface Physics, Process and Characterization"

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

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