Name: Semiconductor Memory Testing: Fault Models and Test Considerations for High Performance Embedded SRAM's
SKU: 46654493
Price: 58.41 EUR
Availability: InStock
Author: Anuj Gupta

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portada Semiconductor Memory Testing: Fault Models and Test Considerations for High Performance Embedded SRAM's

Semiconductor Memory Testing: Fault Models and Test Considerations for High Performance Embedded SRAM's

Type

Physical Book

Publisher

Vdm Verlag

Author

Anuj Gupta

Format

Paperback

ISBN13

9783639194401

Semiconductor Memory Testing: Fault Models and Test Considerations for High Performance Embedded SRAM's

Anuj Gupta (Author) · Vdm Verlag · Paperback

New Book Imported to Netherlands

Delivery: 21 Sep - 28 Sep

€ 58,41

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