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portada semiconductor device and failure analysis: using photon emission microscopy
Type
Physical Book
Publisher
Author
Year
2000
Language
English
Pages
288
ISBN
047149240x
ISBN13
9780471492405
Categories

semiconductor device and failure analysis: using photon emission microscopy

Chim, Wai-Kin (Author) · john wiley & sons · Physical Book

semiconductor device and failure analysis: using photon emission microscopy - chim, wai-kin

Cheaper New Book Imported to Netherlands
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Used BookGood Condition Imported to Netherlands
Delivery: 17 Sep - 24 Sep Shipping: 8 to 12 business days.
€ 122,23
Import costs and 9% BTW included in the price ✅
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